NANO 230Synchrotron Characterization of Nanomaterials
Advanced topics in characterizing nanomaterials using synchrotron X-ray sources. Introduction to synchrotron sources, X-ray interaction with matter, spectroscopic determination of electronic properties of nanomagnetic, structural determination using scattering techniques and X-ray imaging techniques. Cross-listed with CENG 230. Students may not receive credit for both NANO 230 and CENG 230.
Prerequisites
From the catalog: “consent of instructor.”