CENG 213Nanoscale Characterization
Examination of nanoscale characterization approaches including imaging, scattering, and spectroscopic techniques and their physical operating mechanisms. Microscopy (optical and electron: SEM, TEM); scattering and diffraction; spectroscopies (EDX, SIMS, mass spec, Raman, XPS, XAS); scanning probe microscopes (SPM, AFM); particle size analysis. Cross-listed with NANO 203. Students may not receive credit for both CENG 213 and NANO 203.
Prerequisites
From the catalog: “graduate standing.”